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F-SPJG3050 Dual-frequency laser interferometer

Dual-frequency laser interferometer
Experiment contents and related subjects:
Zeeman effect of laser - the Zeeman splitting of He-Ne laser in the longitudinal magnetic field
Gain curve of He-Ne laser, the laser longitudinal mode, frequency pulling effect, dual-frequency generation, stabilization of dual-frequency laser’s frequency .
Polarization, left-circularly polarized light, right-circularly polarized light, birefringence of crystals, 1/4 wave plate.
Working principle of dual-frequency laser measurement system, Michelson interferometer, beat frequency, the optical Doppler effect, polarization beam splitter, pyramid prism.
Precision measurement of length (displacement), nano-measurement (special annex is needed).
With special accessories, measurement of linearity, flatness, angle, perpendicularity, nano-displacement measurement and measurement of other physical quantities and signal segments can be achieved.
Features of the instruments:
Imported all hard sealed He-Ne laser is the core component of the equipment. The output power of the laser is greater than 0.8mW, TEM00; the life is more than 12,000 hours and the beat frequency is more than 700 kHz. Various types of optical components are independently collimated, and be open as far as possible. With specialized designed, production of low mechanical structure, the system is more stable, reliable and easy to be operated, comfortable. Relatively complex optical principles can effectively exercise the operation abilities and the principles understanding of students. From he laser frequency stabilization to a complete measurement system open portfolio enables users to assemble experiment devices freely or develop it into a practical system according to the actual situation and research directions.
Complete set of equipment:
He-Ne laser and power supply; longitudinal magnetic field and adjust rack accessories; experimental host; 1/4 wave plate and three-dimensional adjustment rack; polarizer, beam splitter, the prism and the adjustment frame; light intensity probe + adjustment frame, optical film probe + adjust frame frequency, optical experiments such as rail and slide, plus or minus pulse counter (optional), phase meter (optional), FP scanning interferometer (optional), oscilloscope (self-contained) and etc..
 
                                                      
 
 
 
 
 
 
 
 
 
 


 
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